Description
Product Details
- Published:
- 01/01/1998
- File Size:
- 1 file , 420 KB
Sale!
JIS R 1636:1998
$14.50
Test method for thickness of fine ceramic thin films — Film thickness by contact probe profilometer (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/1998
Related products
-
Sale!
