Description
The method described in this document applies to all reliability mechanisms associated with electronic devices.
The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.
Product Details
- Published:
- 03/01/2022
- Number of Pages:
- 20
- File Size:
- 1 file , 370 KB
- Note:
- This product is unavailable in Belarus, Russia, Ukraine
