Sale!

IEEE P1450

$75.00

IEEE Draft Standard Test Interface Language (STIL) for Digital Test Vector Data
standard by IEEE,

Description

Revision Standard – Active – Draft.Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.

Product Details

ISBN(s):
9781504499590
Number of Pages:
140
File Size:
1 file , 1.5 MB
Product Code(s):
STDUD26338
Note:
This product is unavailable in Russia, Belarus