Description
Adopts ISO 14606:2000 to give guidance on the optimization of sputter depth profiling parameters using appropriate single-layered and multi-layered reference materials in order to achieve optimum depth resolution as a function of instrument settings.
Product Details
- Edition:
- 1st
- Published:
- 10/20/2006
- ISBN(s):
- 0733777953
- Number of Pages:
- 15
- File Size:
- 1 file , 690 KB
- Product Code(s):
- 10148313, 10148302, 10148310
