Description
1.1 This test method provides a procedure to determine the ability of a photovoltaic (PV) module to endure the long-term effects of periodic “hot spot” heating associated with common fault conditions such as severely cracked or mismatched cells, single-point open circuit failures (for example, interconnect failures), partial (or nonuniform) shadowing, or soiling. Such effects typically include solder melting or deterioration of the encapsulation, but in severe cases could progress to combustion of the PV module and surrounding materials.
Product Details
- Published:
- 08/01/2023
- Number of Pages:
- 5
- File Size:
- 1 file , 430 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
