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CH-15-006 — (RP-1499) Dependence Of ESD Charge Voltage On Humidity In Data Centers-Part 3: Estimation Of ESD-Related Risk In Data Centers Using Voltage Level Extrapolation And Chebyshev’s Inequality

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Conference Proceeding by ASHRAE, 2015

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Description

This paper is based on findings resulting from ASHRAE Research Project RP-1499.

This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions:45%relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESDrelated upsets or failures caused by reducing theRHfrom 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribocharging- induced voltage is not directly known, Chebyshev’s inequality is used to predict the upper bound for the probability of ESD-related failures.

Citation: ASHRAE Transactions – Volume 121, Part 1, Chicago, IL

Product Details

Published:
2015
Number of Pages:
9
File Size:
1 file , 4.4 MB
Product Code(s):
D-CH-15-006

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